EIKOS Enables Routine, High-Performance 3D Nanoanalysis for Both Industrial and Research Applications
CAMECA, a world leader in scientific instrumentation and metrology solutions, has launched a new EIKOS atom probe microscope. Utilizing standard microscopy sample preparation methods, EIKOS delivers nanoscale structural information that is expected to yield a greater understanding of materials for research and faster development of products for industrial applications.
CAMECA EIKOS Atom Probe.
EIKOS is designed to address a wide variety of applications including metals, nuclear structural materials, thin films and coatings. Its standard specimen preparation methods and mature data analysis routines make it the new, cost-effective tool for alloy development and nanoscale materials research, and a most-valuable addition to CAMECA’s atom probe tomography product line.
The EIKOS platform is available in two configurations:
•The base EIKOS system, incorporating a reflectron design that combines excellent mass resolving power and low signal-to-noise ratio with a voltage pulsing system to ensure very-high data quality on a wide variety of metallurgical applications, and
•The fully configured EIKOS-X system, which adds an integrated, automated laser pulsing module with computer-controlled focused spot design to provide access to a larger application range. The base EIKOS system can be field upgraded to the EIKOS-X.
Developed and manufactured by CAMECA, atom probe microscopes are used by the most prestigious research and development laboratories around the world. Atom probe tomography (APT or 3D APT) is the only materials analysis technique offering extensive capability for both 3D imaging and chemical composition measurements at the atomic scale. Since its development in the 1960s, the technique has contributed to major advances in materials science.
The CAMECA Atom Probe Tomography product line now comprises two families: the LEAP 5000 (Local Electrode Atom Probe), which provides the fastest, most sensitive 3D imaging and analysis with nanoscale resolution across the widest range of applications (metals, oxides, ceramics, advanced energy storage materials, semiconductors and electronics, bio-minerals and geochemistry), and the newly launched EIKOS family, which offers accessibility to atom probe tomography with improved ease of use and a low cost of ownership that addresses both research and industrial applications
